Low-Energy Argon Broad Ion Beam and Narrow Ion Beam Milling of In Situ Lift-Out FIB Specimens
نویسندگان
چکیده
منابع مشابه
Focused Ion Beam (FIB) Circuit Edit
Introduction While focused ion beam (FIB) circuit edit has been used for quite some time on older process nodes, it now offers even more important benefits as the industry migrates to smaller technologies. The stakes are rising at 28 nm and beyond, and it can now cost $10 million or more to bring a device to market. Manufacturers looking to mitigate risk are using FIB circuit edit to reduce cos...
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1 Department of Physics, University of Central Florida, P.O. Box 162385, Orlando, USA 2 Department of Microelectronics and Semiconductor Devices, Technical University of Moldova, Stefan cel Mare Blvd. 168, 2004, Chisinau, Moldova 3 Apollo Technologies, Inc., 205 Waymont Court, S111, FL 32746, Lake Mary, USA 4 Advanced Materials Processing and Analysis Center, and Department of Mechanical, Mater...
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Motional heating of trapped atomic ions is a major obstacle to their use as quantum bits in a scalable quantum computer. The detailed physical origin of this heating is not well understood, but experimental evidence suggests that it is caused by electric-field noise emanating from the surface of the trap electrodes. In this study, we have investigated the role of adsorbates on the electrodes by...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2018
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927618004804